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Pixelated eV-CZT™ detector, 16 Channel ASIC Evaluation System

The eV-MultiPIX™ system is a general purpose, 16 channel, detector test platform that can be used with both planar and pixilated CdZnTe detectors. The system features the low noise eV-330 16 channel preamplifier / shaper ASIC that provides a 5th order Gaussian shaped output. The variable peaking time and channel gain combine with an on-board variable High Voltage Power supply to make this unit a highly flexible test platform. Systems are available with one of two standard pixilated CdZnTe detectors in both three and five millimeter thickness. The system is ideal for testing new CdZnTe detector designs and geometries or for evaluating the eV-330 ASIC’s performance.

Features and Benefits

Operation from a single +12V Power Supply
On-Board Adjustable High Voltage Bias Supply
1000 to 1 High Voltage monitor output
Easy control of ASIC Gain and Peaking Time
Accepts External Test Pulse via BNC connector
BNC connectors for CZT channel outputs
20-Pin Ribbon Cable connects Breakout board for access to all 16 Channel Outputs
500Kcps Maximum count rate.

CZT Dimensions Resolution	Pixel Configuration	Pixel Dimension	Pitch	Typical
5.9 x 5.9 x 5.0mm³	4x4 2D array	1.0 x 1.0mm²	1.1mm	<6% @ 122KeV