Backscatter

eV PRODUCTS has produced various eV-CZT™ based backscatter gauges for thickness measurements of thin films. eV-CZT has unique advantages for both Gamma-ray and X-ray Backscatter applications.

• Flexible design that accommodates both X-ray tubes and Gamma Sources.
  
  
• Improved statistical confidence & reduced statistical error - This detector system can count >4million photons per second. X-ray sources can easily produce this volume of photons and our detectors can process them. This equates to ~10x more photons than standard gamma backscatter using traditional scintallators.
  
  
• eV-CZT has significantly better photon energy resolution than scintallators.
  
  
• eV-CZT is much more stable to diverse temperature ranges compared with scintallators.
  
  
• Photon detection ranges from 6keV to >200keV